Knowledge Management System

EN

ABOUT US: Who we are Members Organization APMP Awards

COMMITTEES: Executive Committee

Technical Committees Acoustics, Ultrasound and Vibration Electricity and Magnetism Fluid Flow Length Mass and Related Quantities Materials Metrology Photometry and Radiometry Amount of Substance Quality System Ionizing Radiation Thermometry Time and Frequency

Focus Groups Climate Change and Clean Air Clean Water Digital Transformation Energy Efficiency Food Safety Medical Metrology

Developing Economies' Committee DEC Champions

APMP-APAC Joint Proficiency Testing Working Group

PROGRAMMES: Technical Committee Initiatives Focus Group Initiatives COVID-19 Response Programme APMP-APAC Joint Proficiency Testing Programme

QS & COMPARISONS: Quality System Comparisons

CAPACITY BUILDING: DEC Programme E-learning

MEETINGS: General Assembly EC meetings EC-CC meetings TC Chairs meeting TC meetings & workshops DEC meetings & workshops FG meetings & workshops APMP-APAC PTWG Meetings & Workshops NMI Directors' Workshop Symposiums

PUBLICATIONS: Documents & Guidelines Newsletters News Events Photo Gallery Video Gallery

Home TC meetings & workshops TCL TCL Workshop 2023 Shenzhen

General Assembly

EC meetings

EC-CC meetings

TC Chairs meeting

TC meetings & workshops: TCAUV TCEM TCFF TCL TCM TCMM TCPR TCQM TCQS TCRI TCT TCTF

DEC meetings & workshops: DEC committee

FG meetings & workshops: CCCAFG CWFG DXFG EEFG FSFG MMFG

APMP-APAC PTWG Meetings & Workshops

NMI Directors' Workshop

Symposiums

TCL Workshop 2023 Shenzhen

Meeting documents

APMP_23_00.Workshop_Agenda.pdf APMP_23_01.Thanks & Welcome.pdf APMP_23_02.Reliability verification method of thin-film thicknesses.pdf APMP_23_03.Ultra Precision Displacement Measuring Interferometry.pdf APMP_23_04.Flatness and parallelism measurement.pdf APMP_23_05.Micro-scale Surface Metrology by Non-contact Optical Methods.pdf APMP_23_06.Influence of the Layout of the Laser Multilateral Coordinate Measuring System.pdf